Research output per year
Research output per year
Personal profile
Education/Academic qualification
Masters Degree, Master of Arts in Teaching and Learning, Institute of Technology Carlow
01 Sep 2019 → 30 May 2020
Award Date: 01 Oct 2020
PhD, PhD Analysis of Silicon Wafer Damage due to Nanoindentation by Micro-Raman Spectroscopy and White Beam Synchrotron X-Ray Topography, Dublin City University
01 Feb 2009 → 20 Feb 2013
Award Date: 01 Oct 2014
Bachelors Degree, B.Eng. (Hons) Electronic Engineering, Institute of Technology Tallaght
01 Sep 1995 → 30 May 2005
Award Date: 01 Sep 2005
Fingerprint
Dive into the research topics where David Allen is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
- 1 Similar Profiles
-
Quantitative imaging of the stress/strain fields and generation of macroscopic cracks from indents in silicon
Tanner, B. K., Allen, D., Wittge, J., Danilewsky, A. N., Garagorri, J., Gorostegui-Colinas, E., Elizalde, M. R. & McNally, P. J., 14 Nov 2017, In: Crystals. 7, 11, 347.Research output: Contribution to journal › Article › peer-review
Open Access6 Citations (Scopus) -
X-ray asterism and the structure of cracks from indentations in silicon
Tanner, B. K., Garagorri, J., Gorostegui-Colinas, E., Elizalde, M. R., Allen, D., McNally, P. J., Wittge, J., Ehlers, C. & Danilewsky, A. N., Feb 2016, In: Journal of Applied Crystallography. 49, p. 250-259 10 p.Research output: Contribution to journal › Article › peer-review
Open Access2 Citations (Scopus) -
Local strain and defects in silicon wafers due to nanoindentation revealed by full-field X-ray microdiffraction imaging
Li, Z. J., Danilewsky, A. N., Helfen, L., Mikulik, P., Haenschke, D., Wittge, J., Allen, D., McNally, P. & Baumbach, T., 01 Jul 2015, In: Journal of Synchrotron Radiation. 22, p. 1083-1090 8 p.Research output: Contribution to journal › Article › peer-review
Open Access7 Citations (Scopus) -
Crack propagation and fracture in silicon wafers under thermal stress
Danilewsky, A., Wittge, J., Kiefl, K., Allen, D., McNally, P., Garagorri, J., Elizalde, M. R., Baumbach, T. & Tanner, B. K., Aug 2013, In: Journal of Applied Crystallography. 46, 4, p. 849-855 7 p.Research output: Contribution to journal › Article › peer-review
Open Access27 Citations (Scopus) -
X-ray diffraction imaging for predictive metrology of crack propagation in 450-mm diameter silicon wafers
Tanner, B. K., Wittge, J., Vagovič, P., Baumbach, T., Allen, D., McNally, P. J., Bytheway, R., Jacques, D., Fossati, M. C., Bowen, D. K., Garagorri, J., Elizalde, M. R. & Danilewsky, A. N., 2013, In: Powder Diffraction. 28, 2, p. 95-99 5 p.Research output: Contribution to journal › Conference article › peer-review
7 Citations (Scopus)
Activities
- 1 Organising a conference, workshop, ...
-
Digital Education Conference 2024
Dooly, Z. (Chair), O'Leary, P. (Chair), Noonan, G. (Chair), Allen, D. (Member of programme committee), Cleary, F. (Member of programme committee), Casey, B. (Member of programme committee), Denieffe, D. (Member of programme committee), Griffin, R. (Member of programme committee), Jordan, A. (Member of programme committee), Kavanagh, Y. (Member of programme committee), O'Keeffe, K. (Member of programme committee), Raftery, D. (Member of programme committee), Romanyatova, N. (Member of programme committee) & Tuite, A. (Member of programme committee)
10 Dec 2024 → 11 Dec 2024Activity: Participating in or organising an event › Organising a conference, workshop, ...
File