Applying new data-entropy and data-scatter methods for optical digital signal analysis

N.D. McMillan, J. Egan, D. Denieffe, S. Riedel, K. Tiernan, G. McGowan, G. Farrell

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)
Original languageUndefined/Unknown
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
DOIs
Publication statusPublished - 2005

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