Abstract
A novel Breakover Diode (BOD) structure for overvoltage protection applications is proposed. The structure incorporates a Surface Breakdown Trigger Mechanism (SBTM), which facilitates the generation of a range of triggering voltages, independent of the starting material's resistivity and by modification of only a single process step. Significant reduction in the tolerance of the triggering voltage (VBF) has also been achieved. The switching point's dependence on the forward breakdown voltage has virtually been eliminated and independent control of the breakover current (IBO) is available. Prototype devices exhibit narrow breakover voltage (VBO) windows and significantly reduced leakage current (IL) ratings. Experimental results are in good agreement with simulated trends.
Original language | English |
---|---|
Pages | 301-304 |
Number of pages | 4 |
Publication status | Published - 1998 |
Event | Proceedings of the 1998 10th International Symposium on Power Semiconductor Devices & ICs, ISPSD'98 - Kyoto, Jpn Duration: 03 Jun 1998 → 06 Jun 1998 |
Conference
Conference | Proceedings of the 1998 10th International Symposium on Power Semiconductor Devices & ICs, ISPSD'98 |
---|---|
City | Kyoto, Jpn |
Period | 03/06/1998 → 06/06/1998 |